Grinding and Dicing Services, Inc.

San Jose, CA. GDSI has announced the installation of their second NSX 95 automated defect inspection tool targeting macro defects. The NSX® Series is a proven high-throughput and repeatable macro defect inspection solution used throughout the device manufacturing process. Macro defects (defects 0.5 micron and larger) can be created during wafer manufacturing, probing, bumping, dicing, or by general handling, and can have a major impact on the quality of a microelectronic device. The NSX quickly and accurately detects yield-inhibiting defects, providing quality assurance and valuable process information. This information may be useful for further analysis and review, reducing manufacturing costs and time to market. GDSI can help you reduce fab level defects by leveraging the NSX 95’s capabilities.