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A Clearer View
 
Automated inspection up to 400x the human eye for a clearer view. GDSI’s Automated Inspection services provide improved product quality, manufacturing productivity and time to market.

Macro defects can happen during wafer manufacturing, probing, bumping, dicing, or by general handling, and can have a major impact on the quality of a microelectronic device. Our NSX-95s quickly and accurately detect yield-inhibiting defects, providing quality assurance and valuable process information.

Click here if you would like to learn more about GDSI's preferred map importation format for your specific wafers.
 
 
Capabilities
 
  • Full/Partial Wafer Inspection
  • Specifications
    • Commercial Standard
    • Mil 883
    • Customer Specific
  • Electrical Test Map Importing
  • Pick Map/Yield Reports Exporting
 
Allow GDSI to take your thinned wafer all the way to singulated die form by utilizing our grinding, polishing, dicing and pick & place services.
 
 
Equipment List
 
  • 2 Automated NSX-95 Inspection
  • Automated Handling Equipment
  • Automated Tape Mounter
  • Automated Cassette-to-Cassette Grinding Tools